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Atomic Force Microscope Table-top
Expanding application areas AFM applications are not only restricted to surface measurements, but also include environmental control, mechanical properties, electrical properties and magnetic properties at nanometric level Organic polymers Plastic rubber Silicon devices power semiconductor components LCD cold screen Glass and ceramic Wiring, memory storage media Protein collagen cells Semiconductor electronic Inorganic materials Metal, dielectric materials Magnetic material Biological sample Surface roughness measurement, Particle analysis, Spacing measurement, Step height measurement Viscoelasticity, Friction, Adhesion, Young's modulus Glass transition, Softening, Thermal conditions Leakage current, Conductivity, Polarization characteristics, Dielectric constant, Surface potential Domain walls, Magnetic properties, Magnetic spin Etching, Manipulation control, Anodizing, Scratches
Mode :Contact mode, Tapping mode, Phase mode ,MFM mode, LFM mode, EFM mode
- Sample size: ≤9cm, height≤2cm
- Scanning ranges: XY:20 um±1um, Z:2 um
- Scanner resolution: XY: 0.2 nm, Z: 0.05 nm
- Sample moving range (XY):0-13 mm
- Scan rate:0.6Hz-4.34Hz
- Scan angle: 0-360
- Optical CCD: 4X / resolution 2.5 um
- Isolation design: Head hanging on spring, inside a sealed metal case.
9. Enclosed soundproof box: with LED lighting system, humidity control and temperature and humidity display
A.Product size: length × width × height ≤ 450 × 400 × 750 mm
B.Product weight: ≤ 35kg
With the operation and analysis software, notebook computer *1, AFM probe 2
It has an image processing device for scanning samples, and can simultaneously analyze the film thickness, roughness, particle size distribution and size of the nanometre and more image information. The probe can be applied to soft and hard materials and has a quick changeable probe design, such as magnetic probe holder exchange.
NOTE:- Many OPtions are available on users need.